Micro beam white light Laue diffraction technology is a powerful means to obtain local microstructure information of materials, with a spatial resolution of up to submicron. It has unique advantages that cannot be compared to conventional diffraction and micro beam monochromatic light diffraction. Important local microstructures such as crystal structure, defect structure, grain orientation distribution, grain boundaries, dislocation distribution, elastic and plastic strain, and their dynamic evolution over time can be obtained from the samples. Micro beam white light Laue diffraction has the advantages of high flux, fast data acquisition, and high spatial resolution, making it particularly suitable for conducting various in-situ experimental studies.
The R&D team of Caihui has designed a user-friendly software system that integrates control and data analysis for the micro beam white light diffraction experimental line station under construction at Shanghai Synchrotron Radiation Light Source. The software system includes control programs for various components of the beam line, data acquisition and processing programs, etc.